Kelvin probe force microscopy
502.825 / K299
Kelvin probe force microscopy : from single charge detection to device characterization / edited by Sascha Sadewasser and Thilo Glatzel .- Switzerland: Springer, 2018 .- xxiv, 521p. .- ( Springer series in surface sciences ** / edited by Roberto Car; v.65 )
ISBN: 9783319756868
Subject Headings:
Atomic force microscopy;
Thermodynamics;
Engineering;
Author Added Entry:
Glatzel, Thilo [ed.];
Sadewasser, Sascha [ed.];
Copy Details:
Acc. No.: A183980, Full Call No.: 502.825 K299, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Kelvin probe force microscopy : from single charge detection to device characterization / edited by Sascha Sadewasser and Thilo Glatzel .- Switzerland: Springer, 2018 .- xxiv, 521p. .- ( Springer series in surface sciences ** / edited by Roberto Car; v.65 )
ISBN: 9783319756868
Subject Headings:
Atomic force microscopy;
Thermodynamics;
Engineering;
Author Added Entry:
Glatzel, Thilo [ed.];
Sadewasser, Sascha [ed.];
Copy Details:
Acc. No.: A183980, Full Call No.: 502.825 K299, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------