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Fundamentals of surface and thin film analysis (Record no. 275954)

MARC details
000 -LEADER
fixed length control field 00557pam a2200205a 44500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220713111011.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b1986 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 0444009892
040 ## - CATALOGING SOURCE
Transcribing agency IIT Kanpur
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.41
Item number F333F
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Feldman, Leonard C.
245 1# - TITLE STATEMENT
Title Fundamentals of surface and thin film analysis
Statement of responsibility, etc Leonard C. Feldman
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication New York
Name of publisher North-Holland
Year of publication 1986
300 ## - PHYSICAL DESCRIPTION
Number of Pages xviii,352p
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Surfaces (Technology) -- Analysis
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Mayer, James W [ed.]
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Full call number Accession Number Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007 530.41 F333F A95274 Books

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