Semiconductor material and device characterization (Record no. 327563)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00548pam a2200205a 44500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250526101954.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408bc1990 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0471511048 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IIT Kanpur |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | Sch75s |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Schroder, Dieter K. |
| 245 1# - TITLE STATEMENT | |
| Title | Semiconductor material and device characterization |
| Statement of responsibility, etc | Dieter K. Schroder |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | New York |
| Name of publisher | John Wiley |
| Year of publication | 1990 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xv, 599p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Semiconductors |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Semiconductors -- Testing |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Text Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Full call number | Accession Number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| TEXT | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.38152 Sch75s | A110641 | Text Books |