DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING (Record no. 327832)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00480pam a2200169a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408bc1987 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0124967533 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38173 |
| Item number | D492 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Miller, D. M. |
| 245 1# - TITLE STATEMENT | |
| Title | DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | London |
| Name of publisher, distributor, etc. | Academic Pr. |
| Date of publication, distribution, etc. | c1987 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | x,440 |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Perspectives In Computing |
| Volume/sequential designation | V. 18 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Digital Integrated Circuits -- Testing |
| 964 ## - | |
| -- | CIRC |
| 997 ## - | |
| -- | A100700 s C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Damaged (F) | COMPACT STORAGE (BASEMENT) | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.38173 D492 | A100700 | 08/04/2016 | Book Request | 08/04/2016 | Books |