Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

RELIABILITY, YIELD, AND STRESS BURN-IN (Record no. 331225)

MARC details
000 -LEADER
fixed length control field 00666pam a2200193a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b1998 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0792381076
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Item number K964R
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kuo,Way, Chien,Wei-Ting Kary
245 1# - TITLE STATEMENT
Title RELIABILITY, YIELD, AND STRESS BURN-IN
Statement of responsibility, etc. UNIFIED APPROACH FOR MICROELECTRONICS SYSTEMS MANUFACTURING & SOFTWARE DEVELOPMENT
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Kluwer Academic Publishers,Boston
Date of publication, distribution, etc. 1998
300 ## - PHYSICAL DESCRIPTION
Extent xxvi,394
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated Circuits--Design And Construction
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics--Reliability
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Computer Software--Development
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Kim,Taeho
964 ## -
-- CIRC
997 ## -
-- A126385 s C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Uniform Resource Identifier Price effective from Koha item type
        COMPACT STORAGE (BASEMENT) PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007   621.381 K964R A126385 08/04/2016 Book Request 08/04/2016 Books

Powered by Koha