RELIABILITY, YIELD, AND STRESS BURN-IN (Record no. 331225)
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000 -LEADER | |
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fixed length control field | 00666pam a2200193a 44500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 160408b1998 xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0792381076 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.381 |
Item number | K964R |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Kuo,Way, Chien,Wei-Ting Kary |
245 1# - TITLE STATEMENT | |
Title | RELIABILITY, YIELD, AND STRESS BURN-IN |
Statement of responsibility, etc. | UNIFIED APPROACH FOR MICROELECTRONICS SYSTEMS MANUFACTURING & SOFTWARE DEVELOPMENT |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | |
Name of publisher, distributor, etc. | Kluwer Academic Publishers,Boston |
Date of publication, distribution, etc. | 1998 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xxvi,394 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Integrated Circuits--Design And Construction |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Microelectronics--Reliability |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Computer Software--Development |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Kim,Taeho |
964 ## - | |
-- | CIRC |
997 ## - | |
-- | A126385 s C |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
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COMPACT STORAGE (BASEMENT) | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.381 K964R | A126385 | 08/04/2016 | Book Request | 08/04/2016 | Books |