THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS (Record no. 341606)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00495pam a2200169a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408b1992 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0 19 856432 5 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | R39 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Richards,B. P.,Footner,P. K. |
| 245 1# - TITLE STATEMENT | |
| Title | THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | |
| Name of publisher, distributor, etc. | Oxford Univ. Pr.,Oxford |
| Date of publication, distribution, etc. | 1992 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | vi 108 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors -- Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Microscope And Microscopy |
| 964 ## - | |
| -- | CIRC |
| 997 ## - | |
| -- | A116025 s C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| COMPACT STORAGE (BASEMENT) | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.38152 R39 | A116025 | 08/04/2016 | Book Request | 08/04/2016 | Books |