POWER-CONSTRAINED TESTING OF VLSI CIRCUITS (Record no. 347980)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00562pam a2200181a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408b2003 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 140207235X |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3950287 |
| Item number | N545P |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Nicolici,Nicola |
| 245 1# - TITLE STATEMENT | |
| Title | POWER-CONSTRAINED TESTING OF VLSI CIRCUITS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | |
| Name of publisher, distributor, etc. | Kluwer Academic Publishers, Boston |
| Date of publication, distribution, etc. | 2003 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | x,178 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated Circuits, Very Large Scale Integration -- Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors -- Thermal Properties |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Al-Hashimi,Bashir M |
| 964 ## - | |
| -- | CIRC |
| 997 ## - | |
| -- | A148129 s s C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| COMPACT STORAGE (BASEMENT) | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.3950287 N545P | A148129 | 08/04/2016 | s | Book Request | 08/04/2016 | Books |