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ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS (Record no. 356649)

MARC details
000 -LEADER
fixed length control field 00552pam a2200181a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b1986 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0306421402
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.825
Item number AD95
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Newbury,Dale E.
245 1# - TITLE STATEMENT
Title ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Kluwer Academic / Plenum Publishers,New York
Date of publication, distribution, etc. 1986
300 ## - PHYSICAL DESCRIPTION
Extent xii,454
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scanning Electron Microscope
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element X-Ray Microanalysis
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electron Probe Microanalysis
964 ## -
-- Text
-- TEXT
997 ## -
-- A157250 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Total Renewals Full call number Barcode Date last seen Date last checked out Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007 2 5 502.825 AD95 A157250 25/01/2022 07/10/2021 08/04/2016 Books

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