CMOS SRAM circuit design and parametric test in nano-scaled technologies (Record no. 364246)
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000 -LEADER | |
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fixed length control field | 00688pam a2200181a 44500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 160408b2008 xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781402083624 |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | IIT, Kanpur |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.38152 |
Item number | P289c |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Pavlov, Andrei |
245 1# - TITLE STATEMENT | |
Title | CMOS SRAM circuit design and parametric test in nano-scaled technologies |
Remainder of title | process-aware SRAM design and test |
Statement of responsibility, etc. | Andrei Pavlov and Manoj Sachdev |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | New York |
Name of publisher, distributor, etc. | Springer |
Date of publication, distribution, etc. | 2008 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xvi, 193p |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
Title | Frontiers In Electronic Testing / Edited By Vishwani D. Agrawal |
Volume/sequential designation | V.40 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Metaloxide semiconductors, complementary |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Sachdev, Manoj |
997 ## - | |
-- | A165755 C |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
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General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 21/07/2009 | Shruti Book Center | 6603.69 | 621.38152 P289c | A165755 | 08/04/2016 | 08/04/2016 | Books |