Digital system test and testable design (Record no. 368858)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00510pam a2200157a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408b2011 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781441975478 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | IIT, Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Item number | N227d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Navabi, Zainalabedin |
| 245 1# - TITLE STATEMENT | |
| Title | Digital system test and testable design |
| Remainder of title | using HDL models and architectures |
| Statement of responsibility, etc. | Zainalabedin Navabi |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | Springer |
| Date of publication, distribution, etc. | 2011 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xxiii, 435p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Syetems on a chip |
| 997 ## - | |
| -- | A171275 C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 17/03/2011 | Noble Book Stall | 4374.67 | 621.3815 N227d | A171275 | 08/04/2016 | 08/04/2016 | Books |