Kelvin probe force microscopy (Record no. 370647)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00641pam a2200205a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160408b2012 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783642225659 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IITK |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| Item number | K299 |
| 245 0# - TITLE STATEMENT | |
| Title | Kelvin probe force microscopy |
| Remainder of title | measuring and compensating electrostatic forces |
| Statement of responsibility, etc | edited by Sascha Sadewasser and Thilo Glatzel |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Berlin |
| Name of publisher | Springer |
| Year of publication | 2012 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xiv, 331p. |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Springer series in surface sciences |
| 490 ## - SERIES STATEMENT | |
| Series statement | edited By G. Ertl |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Atomic force microscopy |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Sadewasser, Sascha, ed. |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Glatzel, Thilo, ed. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/09/2011 | Vikram Book Depot | 6260.00 | 502.825 K299 | A173557 | Books |