X-ray microscopy and x-ray microanalysis (Record no. 452636)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00570 a2200145 4500 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | P K Kelkar Library, IIT Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 578 |
| Item number | Sy6x |
| 111 ## - MAIN ENTRY--MEETING NAME | |
| Meeting name or jurisdiction name as entry element | Proceedings of the Second International Conference on X-Ray Microscopy and X-Ray Microanalysis |
| Number [OBSOLETE] | Stockholm |
| Date of meeting | 2nd |
| Number of part/section/meeting | 1960 |
| 245 1# - TITLE STATEMENT | |
| Title | X-ray microscopy and x-ray microanalysis |
| Remainder of title | proceedings... |
| Statement of responsibility, etc. | edited by A. Engstrom, Y. Cosslett and H. Pattee |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Amsterdam |
| Name of publisher, distributor, etc. | Elsevier Publishing |
| Date of publication, distribution, etc. | 1960 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | x, 535p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | X-ray microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | X-ray microanalysis |
| 997 ## - | |
| -- | 10920 v. 2 C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| General Stacks | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 578 Sy6x | 10920 | 01/07/2016 | v. 2 | 01/07/2016 | Books |