BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS (Record no. 467380)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00550 a2200181 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 390845039X |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | IN8 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | M No Kittler |
| 245 1# - TITLE STATEMENT | |
| Title | BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS |
| Statement of responsibility, etc. | INTERNATIONAL WORKSHOP ON BEAM INJECTION ASSESSMENT OF DEFECTS IN SEMICONDUCTORS(5TH:1998:BERLIN) |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | |
| Name of publisher, distributor, etc. | Scitech Publishing,Mendham, N.J. |
| Date of publication, distribution, etc. | 1998 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv,537 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors -- Congresses |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Kittler,M |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| h | 0 |
| 964 ## - | |
| -- | CIRC |
| 997 ## - | |
| -- | A129623 s C |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Damaged (F) | COMPACT STORAGE (BASEMENT) | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 12/08/2007 | 621.38152 IN8 | A129623 | 08/07/2016 | Book Request | 08/07/2016 | Books |