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System on chip test architectures (Record no. 468817)

MARC details
000 -LEADER
fixed length control field 00803 aa a2200229 a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20170508152213.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 170508b xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9780123739735
040 ## - CATALOGING SOURCE
Transcribing agency IITK
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Item number Sy87
245 1# - TITLE STATEMENT
Title System on chip test architectures
Remainder of title Nanometer design for testability
Statement of responsibility, etc edited by Laung-Terng wang, Charles E. Stroud and Nur A. Touba
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Amsterdam
Name of publisher Elsevier
Year of publication 2008
300 ## - PHYSICAL DESCRIPTION
Number of Pages xix, 856p
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title The Morgan Kaufmann series in systems on silicon / edited by Wayne Wolf
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term System on a chip -- Testing
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Integrated circuits -- Very large scale integration -- Testing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Laung-Terng [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Stroud, Charles E. [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Touba, Nur A. [ed.]
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Full call number Accession Number Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 25/04/2008 621.395 Sy87 A161217 Books

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