Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

Scanning electron microscopy and x-ray microanalysis [3rd ed.] [Perpetual] (Record no. 563582)

MARC details
000 -LEADER
fixed length control field 02484 a2200277 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20210707093424.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 210204b xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781461502159
040 ## - CATALOGING SOURCE
Transcribing agency IIT Kanpur
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 550
Item number Sca6e3
245 ## - TITLE STATEMENT
Title Scanning electron microscopy and x-ray microanalysis [3rd ed.] [Perpetual]
Statement of responsibility, etc Joseph I. Goldstein ...[et al.]
250 ## - EDITION STATEMENT
Edition statement 3rd ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher Springer
Year of publication 2003
Place of publication New York
300 ## - PHYSICAL DESCRIPTION
Number of Pages xix, 708p
520 ## - SUMMARY, ETC.
Summary, etc In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Scanning electron microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term X-ray microanalysis
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Goldstein, Joseph I.
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Newbury, Dale E.
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Echlin, Patrick
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Lyman, Charles E.
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://link.springer.com/book/10.1007/978-1-4615-0215-9
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Source of acquisition Cost, normal purchase price Full call number Accession Number Cost, replacement price Koha item type
        Electronic Resources PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 20/07/2021 88 41852.03 550 Sca6e3 EBK10686 39859.08 E books

Powered by Koha