Normal view MARC view ISBD view

SCANNING ELECTRON MICROSCOPY

By:

Material type: Text

TextPublication details: New York Mcgraw-Hill 1974Description: 421Subject(s):

DDC classification:

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	General Stacks	502.8 W462 (Browse shelf(Opens below))	Available		A41131

Total holds: 0

Previous		No cover image available	No cover image available	No cover image available				Next
Previous	502.8 H323 V.2 PRINCIPLES AND TECHNIQUES OF SCANNING ELECTRON MICROSCOPY	502.8 R589i AN INTRODUCTION TO MICROSCOPY BY MEANS OF LIGHT, ELECTRONS, X-RAYS , OR ULTRASOUND	502.8 W462 SCANNING ELECTRON MICROSCOPY	502.8 W462 SCANNING ELECTRON MICROSCOPY	502.82 Ap58 Applied scanning probe methods X	502.82 AT71 ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES	502.82 B745M MATERIALS ANALYSIS USING A NUCLEAR MICROPROBE	Next

Bibliography P. : 340-406

There are no comments on this title.

to post a comment.

Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)