ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS
Material type:
TextPublication details: Reading Mass. Benjamin/Cummings 1981Description: xi,543Subject(s): DDC classification: - 621.38154 M297e
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38154 M297e (Browse shelf(Opens below)) | Link to resource | Available | A81965 |
Total holds: 0
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| 621.38154 F228e ELECTRONIC TESTING | 621.38154 In7b INSTABILITIES IN SILICON DEVICES | 621.38154 K958M MODERN ELECTRONIC TEST AND MEASURING INSTRUMENTS | 621.38154 M297e ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS | 621.38154 N213 NATIONAL CONFERENCE ON INSTRUMENTATION | 621.38154 N214d DIGITAL IMAGE PROCESSING AND ANALYSIS | 621.38154 P274p PRINCIPLES OF INDUSTRIAL INSTRUMENTATION |
Bibliography : P. 527-534
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