TRANSMISSION ELECTRON MICROSCOPY
Material type:
TextSeries: Springer Series In Optical Sciences ; V. 35Publication details: Berlin Springer-Verlag 1984Description: xii,521Subject(s): DDC classification: - 502.82 R273t
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 R273t (Browse shelf(Opens below)) | Available | A80517 |
Total holds: 0
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| 502.82 M951F FUNDAMENTALS OF LIGHT MICROSCOPY AND ELECTRONIC IMAGING | 502.82 M951f2 Fundamentals of light microscopy and electronic imaging | 502.82 R272f Fundamentals of atomic force microscopy | 502.82 R273t TRANSMISSION ELECTRON MICROSCOPY | 502.82 SC63 Scanning probe microscopy | 502.82 SC63P SCANNING PROBE MICROSCOPIES BEYOND IMAGING | 502.82 SCI27 SCIENCE OF MICROSCOPY |
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