ATE : AUTOMATIC TEST EQUIPMENT
Material type:
TextLanguage: English Publication details: New York Mcgraw-Hill 1984Description: xiv, 239pSubject(s): DDC classification: - 621.381548 St76a
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 St76a (Browse shelf(Opens below)) | Link to resource | Available | A88840 |
Total holds: 0
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| 621.381548 P871t TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS | 621.381548 R259c CATHODE RAY OSCILLOSCOPE | 621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE | 621.381548 T233m Test and diagnosis for small-delay defects | 621.381548 T233n Nanometer technology designs high-quality delay tests | 621.381548 W391E ELECTRICAL MEASUREMENT, SIGNAL PROCESSING, AND DISPLAYS |
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