INSTABILITIES IN SILICON DEVICES
Material type:
TextPublication details: Amsterdam North-Holland 1985Description: vSubject(s): DDC classification: - 621.38154 In7b
| Item type | Current library | Collection | Call number | URL | Copy number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38154 In7b (Browse shelf(Opens below)) | Link to resource | v. 2 | Damaged (F) | A106106 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: COMPACT STORAGE (BASEMENT) Close shelf browser (Hides shelf browser)
|
|
No cover image available | No cover image available |
|
No cover image available | No cover image available | ||
| 621.38154 C73K COMMUNICATING WITH SMART OBJECTS | 621.38154 Ei23p POWER ELECTRONICS AND RF POWER SYSTEMS ANALYSIS | 621.38154 F228e ELECTRONIC TESTING | 621.38154 In7b INSTABILITIES IN SILICON DEVICES | 621.38154 K958M MODERN ELECTRONIC TEST AND MEASURING INSTRUMENTS | 621.38154 M297e ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS | 621.38154 N213 NATIONAL CONFERENCE ON INSTRUMENTATION |
There are no comments on this title.
Log in to your account to post a comment.