Image from Amazon.com
TESTING AND DIAGNOSIS OF ANALOG CIRCUITS AND SYSTEMS
Material type:
TextPublication details: New York Van Nostrand Reinhold c1991Description: xiv,248ISBN: - 0442259328
- 621.38195735 T288d
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38195735 T288d (Browse shelf(Opens below)) | Link to resource | Available | A113626 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: COMPACT STORAGE (BASEMENT) Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | No cover image available |
|
No cover image available | No cover image available | No cover image available | ||
| 621.38195735 An13d DATA ACQUISITION PRODUCTS CATALOG | 621.38195735 G798 ANALOG INTEGRATED CIRCUIT DESIGN | 621.38195735 G798 ANALOG INTEGRATED CIRCUIT DESIGN | 621.38195735 T288d TESTING AND DIAGNOSIS OF ANALOG CIRCUITS AND SYSTEMS | 621.381958 AL25 MICROCIRCUIT LEARNING COMPUTERS | 621.381958 Am35 COLLECTION OF TECHNICAL PAPERS | 621.381958 Am35c CHARACTERISTICS OF CURRENT DIGITAL COMPUTERS |
There are no comments on this title.
Log in to your account to post a comment.