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TESTING SEMICONDUCTOR MEMORIES
Material type:
TextPublication details: Chichester John Wiley c1991Description: xxiii,512ISBN: - 0471925861
- 621.38152 G643t
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 G643t (Browse shelf(Opens below)) | Link to resource | Available | A113421 |
Total holds: 0
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No cover image available | No cover image available | ||
| 621.38152 G341e Einstein relation in compound semiconductors and their nanostructures | 621.38152 G449o ORIENTED CRYSTALLIZATION ON AMORPHOUS SUBSTRACTS | 621.38152 G519 GLOW DISCHARGE OF HYDROGENATED AMORPHOUS SILICON | 621.38152 G643t TESTING SEMICONDUCTOR MEMORIES | 621.38152 G758M2 METAL IMPURITIES IN SILICON-DEVICE FABRICATION | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES |
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