TESTING AND RELIABLE DESING OF CMOS CIRCUITS
Material type:
TextPublication details: Boston Kluwer Academic Pub. c1990Description: xiii,231ISBN: - 07923390563
- 621.39732 J559t
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
| Written-off | PK Kelkar Library, IIT Kanpur | Written-of | 621.39732 J559t (Browse shelf(Opens below)) | Not for loan | A113982 |
Total holds: 0
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| 621.395 C314 Digital design and verilog HDL fundamentals | 621.396 P262i2 INDUSTRIAL ELECTRIC FURNACES AND APPLIANCES | 621.396 Sy68 ELECTRIC ARC FURNACE-QUO VADIS | 621.39732 J559t TESTING AND RELIABLE DESING OF CMOS CIRCUITS | 621.398 H778L LOCAL AREA NETWORK DESIGN | 621.399 L95i INTRODUCTRORY COMPUTER VISION AND IMAGE PROCESSING | 621.399 L973P PATTERN RECOGNITION AND IMAGE PROCESSING |
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