The electrical characterization of semiconductors : measurement of minority carrier properties
Material type:
- 0125286252
- 621.38152 Or8e
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
![]() |
PK Kelkar Library, IIT Kanpur | General Stacks | 621.38152 Or8e (Browse shelf(Opens below)) | Available | A111568 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: General Stacks Close shelf browser (Hides shelf browser)
![]() |
![]() |
![]() |
![]() |
No cover image available |
![]() |
![]() |
||
621.38152 N733M MICROLITHOGRAPHY FUNDAMENTALS IN SEMICONDUCTOR DEVICES AND FABRICATION TECHNOLOGY | 621.38152 OP7 OPTICS OF QUANTUM DOTS AND WIRES | 621.38152 OR5H HIGH RESOLUTION FOCUSED ION BEAMS | 621.38152 Or8e The electrical characterization of semiconductors | 621.38152 P194 Optical processes in semiconductors | 621.38152 P275u UNDERSTANDING SEMICONDUCTOR DEVICES | 621.38152 P289c CMOS SRAM circuit design and parametric test in nano-scaled technologies |
There are no comments on this title.
Log in to your account to post a comment.