Image from Amazon.com
PHOTOINDUCED DEFECTS IN SEMICONDUCTORS
Material type:
TextSeries: Cambridge Studies In Semiconductor Physics And Microelectronic Engineering ; Publication details: Cambridge Univ. Press, Cambridge c1996Description: x,217ISBN: - 0521461960
- 621.38152 R247P
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R247P (Browse shelf(Opens below)) | Link to resource | Available | A122285 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: COMPACT STORAGE (BASEMENT) Close shelf browser (Hides shelf browser)
|
|
|
|
|
No cover image available |
|
||
| 621.38152 R182 Rare earth oxide thin films | 621.38152 R219O OPTOELECTRONIC DEVICES | 621.38152 R22 Reactive sputter deposition | 621.38152 R247P PHOTOINDUCED DEFECTS IN SEMICONDUCTORS | 621.38152 R252S SILICON PHOTONICS | 621.38152 R279 RALIABILITY AND DEGRADATION | 621.38152 R39 THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS |
There are no comments on this title.
Log in to your account to post a comment.