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TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS
Material type:
TextSeries: Electrical Engineering And Electronics ; 38Publication details: New York Dekker 1987Description: x,218ISBN: - 0824777050
- 621.381548 P871t
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 P871t (Browse shelf(Opens below)) | Link to resource | Available | A101632 |
Total holds: 0
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| 621.381548 K233B BURN-IN TESTING | 621.381548 M224t THERMISTORS | 621.381548 M866P PRINCIPLES OF TESTING ELECTRONIC SYSTEMS | 621.381548 P871t TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS | 621.381548 R259c CATHODE RAY OSCILLOSCOPE | 621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE |
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