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HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING

By: Contributor(s): Material type: TextTextPublication details: Boston Kluwer Academic Pub. c1990Description: x,159ISBN:
  • 079239058X
Subject(s): DDC classification:
  • 621.38173 B469h
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur General Stacks 621.38173 B469h (Browse shelf(Opens below)) Available A113644
Total holds: 0

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