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RANDOM TESTING OF DIGITAL CIRCUITS
Material type:
TextPublication details: Marcel Dekker, New York 1998Description: xix,475ISBN: - 0824701828
- 621.3815 D281R
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.3815 D281R (Browse shelf(Opens below)) | Available | A125903 |
Total holds: 0
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| 621.3815 C977e ELECTRONIC CIRCUIT ANALYSIS | 621.3815 C977e ELECTRONIC CIRCUIT ANALYSIS | 621.3815 D26c Carbon nanotube and graphene nanoribbon interconnects | 621.3815 D281R RANDOM TESTING OF DIGITAL CIRCUITS | 621.3815 D362g GENERAL ELECTRONICS CIRCUITS | 621.3815 D46 DESIGN OF HIGH - PERFORMANCE MICROPROCESSOR CIRCUITS | 621.3815 D628 DIRECT-WRITE TECHNOLOGIES FOR RAPID PROTOTYPING APPLICATIONS |
Includes Bibliographical References And Index
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