Image from Amazon.com
IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS
Material type:
TextLanguage: English Publication details: John Wiley, New York 2001Description: xi,263ISBN: - 0471241415
- 530.4275 IN2
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 530.4275 IN2 (Browse shelf(Opens below)) | Available | A133206 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: General Stacks Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 530.427 G89t2 Theoretical surface science | 530.427 L95 LOW ENERGY ION-SURFACE INTERACTIONS | 530.427 P43l Liquid surfaces and interfaces | 530.4275 IN2 IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS | 530.4275 IN8H TRENDS AND NEW APPLICATIONS OF THIN FILMS | 530.4275 M919 MULTILAYER THIN FILMS | 530.4275 M919t2 Multilayer thin films [2 v.] |
There are no comments on this title.
Log in to your account to post a comment.