SCANNING PROBE MICROSCOPY

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Material type: Text

TextPublication details: Springer-Verlag,Berlin 2004Description: x,210ISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	General Stacks	502.825 M576S (Browse shelf(Opens below))	Available		A146608

Total holds: 0

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Previous	502.825 In1 In-situ electron microscopy at high resolution	502.825 K299 Kelvin probe force microscopy	502.825 L95 Low voltage electron microscopy	502.825 M576S SCANNING PROBE MICROSCOPY	502.825 M914I2 INTRODUCTION TO CONFOCAL FLUORESCENCE MICROSCOPY	502.825 P376H HIGH-ENERGY ELECTRON DIFFERACTION AND MICROSCOPY	502.825 P954S SCANNING AUGER ELECTRON MICROSCOPY	Next

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