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SELECTED PAPERS ON CCD AND CMOS IMAGERS
Material type:
TextPublication details: Spie-The International Soc. For Optical Engg., Washington 2003Description: xvi,636ISBN: - 0819451142
- 621.38152 SE48K
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 SE48K (Browse shelf(Opens below)) | Link to resource | Available | A147746 |
Total holds: 0
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| 621.38152 R52 RADIATION DAMAGE AND DEFECTS IN SEMICONDUCTORS | 621.38152 Sa87w WORKING WITH SEMICONDUCTORS | 621.38152 SC27 SCIENCE AND TECHNOLOGY OF ELECTROCERAMIC THIN FILMS | 621.38152 SE48K SELECTED PAPERS ON CCD AND CMOS IMAGERS | 621.38152 SE52 SEMICONDUCTOR MICROMACHINING | 621.38152 Se52 Semiconductor nanostructures for optoelectronic applications | 621.38152 Se52 SEMICONDUCTOR RELIABILITY |
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