Image from Amazon.com
PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY
Material type:
TextPublication details: Springer Science+Business Media Inc., New York 2005Description: v,202ISBN: - 0 387 25800 0
- 502.825 EG28P
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 EG28P (Browse shelf(Opens below)) | Available | A153884 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: General Stacks Close shelf browser (Hides shelf browser)
|
No cover image available |
|
|
No cover image available |
|
|
||
| 502.825 AD95 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY | 502.825 G618f Thin foil preparation for electron microscopy | 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy |
There are no comments on this title.
Log in to your account to post a comment.