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X-RAY METROLOGY IN SEMICONDUCTOR MANUFACTURING

By: Contributor(s): Material type: TextTextPublication details: Crc Press, Boca Raton 2006Description: 277ISBN:
  • 0849339286
Subject(s): DDC classification:
  • 621.38152 B675X
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Holdings
Item type Current library Collection Call number URL Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur COMPACT STORAGE (BASEMENT) 621.38152 B675X (Browse shelf(Opens below)) Link to resource Available A155172
Total holds: 0

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