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ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES
Material type:
TextPublication details: Vsp, Leiden 2005Description: x,811ISBN: - 90 6764 434 X
- 502.82 AT71
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 AT71 (Browse shelf(Opens below)) | Available | A156874 |
Total holds: 0
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| 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.8 W462 SCANNING ELECTRON MICROSCOPY | 502.82 Ap58 Applied scanning probe methods X | 502.82 AT71 ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES | 502.82 B745M MATERIALS ANALYSIS USING A NUCLEAR MICROPROBE | 502.82 C421i2 Introduction to scanning tunneling microscopy | 502.82 C874u Under the microscope |
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