DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS

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Material type: Text

TextSeries: Frontiers In Electronic Testing ; Publication details: Springer,Aa Dordrecht 2007Edition: 2ndDescription: xx,328ISBN:

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Holdings
Item type	Current library	Collection	Call number	URL	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)	621.3815 SA14D2 (Browse shelf(Opens below))	Link to resource	Available		A159498

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Previous	621.3815 R913m MODULATION AND CODING IN INFORMATION SYSTEMS	621.3815 R913m MODULATION AND CODING IN INFORMATION SYSTEMS	621.3815 R913m MODULATION AND CODING IN INFORMATION SYSTEMS	621.3815 SA14D2 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS	621.3815 Sa97i Invention of integrated circuits	621.3815 Sch95s SELECTED SEMICONDUCTOR CIRCUITS HANDBOOK	621.3815 Se42s SEMICONDUCTOR FUNDAMENTALS	Next

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