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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

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Contributor(s): Material type: TextTextSeries: Circuits, Devices And Systems Series ; No. 19Publication details: London The Institution Of Engineering And Technology 2008Description: xx, 389pISBN:
  • 9780863417450
Subject(s): DDC classification:
  • 621.38150287 T286
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Holdings
Item type Current library Collection Call number URL Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur COMPACT STORAGE (BASEMENT) 621.38150287 T286 (Browse shelf(Opens below)) Link to resource Available A166155
Total holds: 0

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