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Emerging nanotechnologies : test, defect tolerance and reliability
Material type:
TextSeries: Frontiers In Electronic Testing / Edited By Vishwani Agrawal ; No.37Publication details: New York Springer 2008Description: xii, 405pISBN: - 9780387747460
- 620.5 Em32
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.5 Em32 (Browse shelf(Opens below)) | Link to resource | Available | A167523 |
Total holds: 0
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