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The MOCVD challenge : a survey of GaInAsP-InP and GaInAsP-GaAs for photonic and electronic device applications
Material type:
TextSeries: Electronic Materials And Devices Series / Edited By Yongbing Xu ; Publication details: Boca Raton Crc Press 2011Edition: 2ndDescription: xx, 779pISBN: - 9781439806982
- 621.381 R219m2
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.381 R219m2 (Browse shelf(Opens below)) | Available | A170165 |
Total holds: 0
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| 621.381 R219F FUNDAMENTALS OF SOLID STATE ENGINEERING | 621.381 R219f Fundamentals of microelectronics | 621.381 R219F2 FUNDAMENTALS OF SOLID STATE ENGINEERING | 621.381 R219m2 The MOCVD challenge | 621.381 R241R RF MEMS | 621.381 R279 Reliability of MEMS | 621.381 R567 ELECTRONIC CONCEPTS |
Includes Bibliographical References And Index
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