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Reliability and radiation effects in compound semiconductors
Material type:
TextPublication details: New Jersey World Scientific 2010Description: xii, 363pISBN: - 9789814277105
- 621.38152 J641r
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 J641r (Browse shelf(Opens below)) | Link to resource | Available | A170796 |
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| 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS 2001 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 J641r Reliability and radiation effects in compound semiconductors | 621.38152 J832 SEMICONDUCTOR DEVICES | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS |
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