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Novel algorithms for fast statistical analysis of scaled circuits

By:

Singhee, Amith

Contributor(s):

Rutenbar, Rob A

Material type: Text

Text

TextSeries: Lecture Notes In Electrical Engineering ; V. 46Publication details: Dordrecht Springer Science+Business Media 2009Description: xv, 195pISBN:

9789048130993

Subject(s):

Nanoelectronics -- Statistical methods

DDC classification:

621.381 Si64n

Average rating: 0.0 (0 votes)

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Holdings
Item type	Current library	Collection	Call number	URL	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)	621.381 Si64n (Browse shelf(Opens below))	Link to resource	Available		A171260

Total holds: 0

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Previous	621.381 Sh83 ELECTRONIC FUNDAMENTALS FOR TECHNICIAN	621.381 Si15s SIFERRIT AND SIRUFER MATERIAL, TRANSFORMERS, ELECTRONIC CIRCUIT BLOCKS	621.381 SI59A SIMULATION AND DESIGN OF MICROSYSTEMS AND MICROSTRUCTURES	621.381 Si64n Novel algorithms for fast statistical analysis of scaled circuits	621.381 SM25C SMART SENSORS, ACTUATORS, AND MEMS	621.381 SM25V SMART ELECTRONICS, MEMS, BIOMEMS, AND NANOTECHNOLOGY	621.381 SM25V SMART ELECTRONICS, MEMS, BIOMEMS, AND NANOTECHNOLOGY V.5389	Next

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P K Kelkar Library

Indian Institute of Technology, Kalyanpur, Kanpur, U P 208016 India| Web: https://pkklib.iitk.ac.in

Email : librarian@iitk.ac.in | Phone : +91 512 259-7233

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