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Microelectronic reliability
Material type:
TextPublication details: Norwood Artech House 1989Description: xviii, 374pISBN: - 0890062846
- 621.38152 M583
Contents:
Contents: Vol.1 - Reliability, test and diagnostics
| Item type | Current library | Collection | Call number | URL | Copy number | Status | Date due | Barcode | Item holds | |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 M583 (Browse shelf(Opens below)) | Link to resource | vol.1 | Available | A107346 |
Total holds: 0
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| 621.38152 M452i ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 M565 METAL BASED THIN FILMS FOR ELECTRONICS | 621.38152 M583 MICROWAVE SUPERCONDUCTIVITY | 621.38152 M583 Microelectronic reliability | 621.38152 M636s SEMICONDUCTOR DEVICES AND INTEGRATED ELECTRONICS | 621.38152 M828N NITRIDE SEMICONDUCTORS AND DEVICES | 621.38152 M842 DESIGN, PERFORMANCE AND APPLICATIONS OF MICROWAVE SEMICONDUCTOR CONTROL COMPONENTS |
Contents: Vol.1 - Reliability, test and diagnostics
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