Nanometer technology designs high-quality delay tests

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Material type: Text

TextPublication details: New York Springer 2008Description: xvii, 281pISBN:

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Holdings
Item type	Current library	Collection	Call number	URL	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)	621.381548 T233n (Browse shelf(Opens below))	Link to resource	Available		A177610

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Previous	621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS	621.381548 St76a ATE	621.381548 T233m Test and diagnosis for small-delay defects	621.381548 T233n Nanometer technology designs high-quality delay tests	621.381548 W391E ELECTRICAL MEASUREMENT, SIGNAL PROCESSING, AND DISPLAYS	621.3815486 C42f Frequency synthesizers	621.3815486 R636M MICROWAVE AND WIRELESS SYNTHESIZERS	Next

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