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Fringe pattern analysis for optical metrology : theory, algorithms, and applications

By: Contributor(s): Material type: TextTextPublication details: Germany Wiley-Vch 2014Description: xvi, 327pISBN:
  • 9783527411528
Subject(s): DDC classification:
  • 535.470287 Se69f
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur General Stacks 535.470287 Se69f (Browse shelf(Opens below)) Available A180207
Total holds: 0

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