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Reliability of MEMS : testing of materials and devices

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Contributor(s): Material type: TextTextSeries: Advanced Micro And Nanosystems ; Publication details: Germany Wiley-Vch 2013Description: xx, 303pISBN:
  • 9783527335015
Subject(s): DDC classification:
  • 621.381 R279
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur General Stacks 621.381 R279 (Browse shelf(Opens below)) Available A180313
Total holds: 0
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621.381 R219F2 FUNDAMENTALS OF SOLID STATE ENGINEERING 621.381 R219m2 The MOCVD challenge 621.381 R241R RF MEMS 621.381 R279 Reliability of MEMS 621.381 R567 ELECTRONIC CONCEPTS 621.381 Sa13e Electronics 621.381 Se59m Microsystem design

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