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NASA Technical Note [NASA TN D-5669]: Evaluation of a flash x-ray technique for recession measurements in ablative materials

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Material type: Text

TextLanguage: English Series: National Aeronautics and Space Administration | NASA Technical NotePublication details: NASA 1970 WashingtonDescription: 22pSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)		NASA TN D-5660 -69	Not for loan		TR14379

Total holds: 0

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Previous	NASA Technical Note [NASA TN D-5666]: Analysis of a hybrid phase-lock loop	NASA Technical Note [NASA TN D-5667]: Effect of 3 1/2 percent silicon on adhesion, friction and wear of iron in various media	NASA Technical Note [NASA TN D-5668]: Statistical analysis of meteoroid penetration data including effects of cutoff	NASA Technical Note [NASA TN D-5669]: Evaluation of a flash x-ray technique for recession measurements in ablative materials	Thermal sensing of the atmosphere from satellites [NASA TT F-626]	ON THE DISSOLUTION OF ZINC IN ALKALIS [NASA TT F-252]	CONTRIBUTION TO THE STUDY OF THE STRUCTURE OF THE IONOSPHERE [NASA TT F253]	Next

Bound together NASA TN D-5660 to 5669

Bound vol. Acc. No. 101185 contains Acc. No. TR14371 to TR14379

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