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MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER

By: Contributor(s): Material type: TextTextSeries: Indira Gandhi Centre ; Publication details: Indira Gandhi Centre For Atomic Research, Kalpakkam 2003Description: v,24Subject(s): DDC classification:
  • GOI-DAE IGC-246/2003
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Technical Report Technical Report PK Kelkar Library, IIT Kanpur General Stacks GOI-DAE IGC-246/2003 (Browse shelf(Opens below)) Not for loan TR20635
Total holds: 0

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