MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER
Material type:
- GOI-DAE IGC-246/2003
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | General Stacks | GOI-DAE IGC-246/2003 (Browse shelf(Opens below)) | Not for loan | TR20635 |
Total holds: 0
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