Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER

By: Contributor(s): Material type: TextTextSeries: Indira Gandhi Centre ; Publication details: Indira Gandhi Centre For Atomic Research, Kalpakkam 2003Description: v,24Subject(s): DDC classification:
  • GOI-DAE IGC-246/2003
Star ratings
    Average rating: 0.0 (0 votes)

Powered by Koha