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Time-of-flight mass spectrometer for studies of ions produced by simulated micromecroroid impact

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Series: NASA Technical Note | D-5794Publication details: Washington NASA 1970Description: 37pSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)		NASA TN D-5795	Not for loan		TR10052

Total holds: 0

Previous	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	Next
Previous	Stagnation-point solutions for inviscid radiating shock layers	Performance and deployment characteristics of a twin-keel parawing with various amounts and permeabilities of porous material in outer lobes	Orbiting astronomical observatory thermal test program	Time-of-flight mass spectrometer for studies of ions produced by simulated micromecroroid impact	High-altitude flight test of a 40-foot-diameter (12.2-meter) ringsail parachute at a deployment mach number of 2.95	Laser heating of ionized helium	Further experimental results on the influence of the turbulent boundary layer on panel flutter	Next

NASA TN -5790-99
Bound Vol.101193;Contents:TR10048-56

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