ELECTRONIC TESTING
Material type:
TextPublication details: N. Y. Mcgraw-Hill c1966Description: 304Subject(s): DDC classification: - 621.38154 F228e
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38154 F228e (Browse shelf(Opens below)) | Link to resource | Damaged (F) | 73281 |
Total holds: 0
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| 621.38154 C23e ELEMENTS OF ELECTRONIC INSTRUMENTATION AND MEASUREMENT | 621.38154 C73K COMMUNICATING WITH SMART OBJECTS | 621.38154 Ei23p POWER ELECTRONICS AND RF POWER SYSTEMS ANALYSIS | 621.38154 F228e ELECTRONIC TESTING | 621.38154 In7b INSTABILITIES IN SILICON DEVICES | 621.38154 K958M MODERN ELECTRONIC TEST AND MEASURING INSTRUMENTS | 621.38154 M297e ELECTRONIC AND INSTRUMENTACION FOR SCIENCTIETS |
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