Item type | Current library | Collection | Call number | URL | Copy number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 535.3325 Eu74 (Browse shelf(Opens below)) | Link to resource | v. 3 | Available | A73197 |
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535.3325 D492 1980 Electron microscopy and analysis, 1979 (EMAG 79) | 535.3325 EL25 ELECTRON MICROSCOPY AND ANALYSIS | 535.3325 Eu74 ELECTRON MICROSCOPY 1972 | 535.3325 Eu74 ELECTRON MICROSCOPY 1980 | 535.3325 G925e ELECTRON MICROSCOPY IN THE STUDY OF MATERIALS | 535.3325 H313e ELECTRON OPTICS AND ELECTRON MICROSCOPY | 535.3325 H851 THE USE OF THE SCANNING ELECTRON MICROSCOPE |
Contents. -- V.1. Physics. -- V.2. Biology. -- V. 3. Analysis
Conference Incorporating The Ninth International Coference On X-Ray Optics And Microanalysis (Icxom)
Organized By The Nederlandse Vereniging Voor Elecgtronemicroscopie
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